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Investigation of additional responses caused by sample surface topography in piezoresponse force microscopy measurement

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The purpose of this study is to elucidate the origin of the additional response signals arising from the surface topography of samples during piezoresponse force microscopy (PFM) measurements. Periodic mountain-shaped protrusions with triangular cross-sections were fabricated on the surface of a silicon single crystal. a material with no inherent piezoelectricity. and PFM measurements... https://www.roneverhart.com/Cute-Bunny-Spa-Headband-3314-46-12-units/
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